Publication:

Optimizing Insulated-Gate Bipolar Transistors' Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests

Date

2024
Journal article
https://doi.org/10.3390/en17112616
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dc.contributor.authorAlavi, Omid
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorDaenen, Michaël
dc.contributor.imecauthorAlavi, Omid
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorDaenen, Michaël
dc.contributor.orcidimecAlavi, Omid::0000-0001-6426-8485
dc.contributor.orcidimecDe Ceuninck, Ward::0000-0002-4630-5569
dc.contributor.orcidimecDaenen, Michaël::0000-0002-9221-4932
dc.date.accessioned2024-08-06T07:43:40Z
dc.date.available2024-06-20T18:15:37Z
dc.date.available2024-08-06T07:43:40Z
dc.date.embargo2024-05-29
dc.date.issued2024
dc.description.wosFundingTextNo Statement Available
dc.identifier.doi10.3390/en17112616
dc.identifier.issn1996-1073
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44067
dc.publisherMDPI
dc.source.beginpageArt. 2616
dc.source.endpageN/A
dc.source.issue11
dc.source.journalENERGIES
dc.source.numberofpages23
dc.source.volume17
dc.subject.keywordsJUNCTION TEMPERATURE-MEASUREMENT
dc.subject.keywordsIGBT MODULES
dc.subject.keywordsSEMICONDUCTOR-DEVICES
dc.subject.keywordsRELIABILITY
dc.subject.keywordsPREDICTION
dc.subject.keywordsIDENTIFICATION
dc.subject.keywordsVALIDATION
dc.subject.keywordsCYCLER
dc.title

Optimizing Insulated-Gate Bipolar Transistors' Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests

dc.typeJournal article
dspace.entity.typePublication
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