Publication:
Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1879 since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations
Metrics
Views
1879 since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations