Publication:
Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques
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1882 since deposited on 2021-10-20
1last month
Acq. date: 2026-10-09
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1882 since deposited on 2021-10-20
1last month
Acq. date: 2026-10-09
Citations