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Conference contributions
Automatic generation of in-circuit tests for board assembly Defects
Publication:
Automatic generation of in-circuit tests for board assembly Defects
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Date
2018-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
van Schaaijk, Harm
;
Spierings, Martien
;
Marinissen, Erik Jan
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1816
since deposited on 2021-10-26
Acq. date: 2025-12-16
Citations
Metrics
Views
1816
since deposited on 2021-10-26
Acq. date: 2025-12-16
Citations