Publication:
Automatic generation of in-circuit tests for board assembly Defects
Date
| dc.contributor.author | van Schaaijk, Harm | |
| dc.contributor.author | Spierings, Martien | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-26T07:27:04Z | |
| dc.date.available | 2021-10-26T07:27:04Z | |
| dc.date.issued | 2018-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32104 | |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8400714/ | |
| dc.source.beginpage | 1 | |
| dc.source.conference | IEEE 23rd European Test Symposium - ETS'18 | |
| dc.source.conferencedate | 29/05/2018 | |
| dc.source.conferencelocation | Bremen Germany | |
| dc.source.endpage | 2 | |
| dc.title | Automatic generation of in-circuit tests for board assembly Defects | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |