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Articles
In situ UHVEM study of {113}-defect formation in Si nanowires
Publication:
In situ UHVEM study of {113}-defect formation in Si nanowires
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
;
Anada, S.
;
Yasuda, H.
;
Van Marcke, Patricia
;
Bender, Hugo
;
Rooyackers, Rita
;
Vandooren, Anne
Journal
Semiconductor Science and Technology
Abstract
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1840
since deposited on 2021-10-23
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Acq. date: 2025-12-15
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Metrics
Views
1840
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-15
Citations