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Evaluating SiGe-on-Si epitaxial quality by inline surface light scattering: a case study on the impact of interfacial oxygen
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Evaluating SiGe-on-Si epitaxial quality by inline surface light scattering: a case study on the impact of interfacial oxygen
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Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wostyn, Kurt
;
Kenis, Karine
;
Rondas, Dirk
;
Loo, Roger
;
Hikavyy, Andriy
;
Douhard, Bastien
;
Mertens, Paul
;
Holsteyns, Frank
;
De Gendt, Stefan
;
Simpson, Gavin
;
Bast, Gerhard
;
Swaminathan, Karthik
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1894
since deposited on 2021-10-22
Acq. date: 2025-12-15
Citations
Metrics
Views
1894
since deposited on 2021-10-22
Acq. date: 2025-12-15
Citations