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Conference contributions
New sensitive electrical measurement techniques for the study of stress induced voiding
Publication:
New sensitive electrical measurement techniques for the study of stress induced voiding
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Date
1998
Proceedings Paper
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2601.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Witvrouw, Ann
;
Drijbooms, Chris
;
Bender, Hugo
;
Maex, Karen
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Abstract
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1902
since deposited on 2021-10-01
Acq. date: 2025-12-15
Citations
Metrics
Views
1902
since deposited on 2021-10-01
Acq. date: 2025-12-15
Citations