Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
New sensitive electrical measurement techniques for the study of stress induced voiding
Publication:
New sensitive electrical measurement techniques for the study of stress induced voiding
Copy permalink
Date
1998
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
2601.pdf
1.34 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Witvrouw, Ann
;
Drijbooms, Chris
;
Bender, Hugo
;
Maex, Karen
Journal
Abstract
Description
Metrics
Views
1903
since deposited on 2021-10-01
1
last month
1
last week
Acq. date: 2026-01-06
Citations
Metrics
Views
1903
since deposited on 2021-10-01
1
last month
1
last week
Acq. date: 2026-01-06
Citations