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On the efficiency of stress techniques in gate-last n-type bulk FinFETs
Publication:
On the efficiency of stress techniques in gate-last n-type bulk FinFETs
Date
2012
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eneman, Geert
;
Collaert, Nadine
;
Veloso, Anabela
;
De Keersgieter, An
;
De Meyer, Kristin
;
Hoffmann, Thomas
;
Horiguchi, Naoto
;
Thean, Aaron
Journal
Solid-State Electronics
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1896
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1896
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations