Publication:

Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition

Date

2022

Proceedings Paper

https://doi.org/10.1109/IRPS48227.2022.9764592

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Author(s)

;

Bakeroot, Benoit

;

;

Posthuma, Niels

;

Decoutere, Stefaan

;

;

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Tallarico, A. N.

Journal

na

Statistics

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Acq. date: 2026-06-06