Publication:
Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition
| dc.contributor.author | Millesimo, M. | |
| dc.contributor.author | Bakeroot, Benoit | |
| dc.contributor.author | Borga, Matteo | |
| dc.contributor.author | Posthuma, Niels | |
| dc.contributor.author | Decoutere, Stefaan | |
| dc.contributor.author | Sangiorgi, E. | |
| dc.contributor.author | Fiegna, C. | |
| dc.contributor.author | Tallarico, A. N. | |
| dc.contributor.imecauthor | Bakeroot, Benoit | |
| dc.contributor.imecauthor | Borga, Matteo | |
| dc.contributor.imecauthor | Posthuma, Niels | |
| dc.contributor.imecauthor | Decoutere, Stefaan | |
| dc.contributor.orcidimec | Bakeroot, Benoit::0000-0003-4392-1777 | |
| dc.contributor.orcidimec | Borga, Matteo::0000-0003-3087-6612 | |
| dc.contributor.orcidimec | Posthuma, Niels::0000-0002-6029-1909 | |
| dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
| dc.date.accessioned | 2023-06-01T13:39:37Z | |
| dc.date.available | 2023-02-27T03:28:35Z | |
| dc.date.available | 2023-06-01T13:39:37Z | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This activity was funded under project iRel40. iRel40 is a European co-funded innovation project that has been granted by the ECSEL Joint Undertaking (JU) under grant agreement No 876659. The funding of the project comes from the Horizon 2020 research programme and participating countries. National funding is provided by Germany, including the Free States of Saxony and Thuringia, Austria, Belgium, Finland, France, Italy, the Netherlands, Slovakia, Spain, Sweden, and Turkey. This project is co-funded by the Ministry of Economic Development in Italy. | |
| dc.identifier.doi | 10.1109/IRPS48227.2022.9764592 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41180 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.journal | na | |
| dc.source.numberofpages | 6 | |
| dc.subject.keywords | PERCOLATION THEORY | |
| dc.subject.keywords | THRESHOLD VOLTAGE | |
| dc.subject.keywords | V-TH | |
| dc.subject.keywords | BREAKDOWN | |
| dc.subject.keywords | TECHNOLOGY | |
| dc.title | Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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