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Contamination control for the 32nm node
Publication:
Contamination control for the 32nm node
Date
2008
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bearda, Twan
;
Vos, Rita
;
Mertens, Paul
;
Catana, Gabriela
;
Huyghebaert, Cedric
Journal
Semiconductor Fabtech
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1927
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations
Metrics
Views
1927
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations