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Trap-Assisted-Tunneling and Shockley-Read-Hall lifetime of extended defects in In.53Ga.47As p-n junctions
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Trap-Assisted-Tunneling and Shockley-Read-Hall lifetime of extended defects in In.53Ga.47As p-n junctions
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Date
2018-06
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hsu, Brent
;
Simoen, Eddy
;
Eneman, Geert
;
Merckling, Clement
;
Mols, Yves
;
Alian, AliReza
;
Langer, Robert
;
Collaert, Nadine
;
Heyns, Marc
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1824
since deposited on 2021-10-25
Acq. date: 2025-12-15
Citations
Metrics
Views
1824
since deposited on 2021-10-25
Acq. date: 2025-12-15
Citations