Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs
Publication:
Refined DC and Low-Frequency Noise Characterization at Room and Cryogenic Temperatures of Vertically Stacked Silicon Nanosheet FETs
Copy permalink
Date
2023
Journal article
https://doi.org/10.1109/TED.2022.3225248
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Published version
2.11 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cretu, Bogdan
;
Veloso, Anabela
;
Simoen, Eddy
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Abstract
Description
Metrics
Downloads
2
since deposited on 2023-01-01
Acq. date: 2026-01-09
Views
1357
since deposited on 2023-01-01
1
last month
1
last week
Acq. date: 2026-01-09
Citations
Metrics
Downloads
2
since deposited on 2023-01-01
Acq. date: 2026-01-09
Views
1357
since deposited on 2023-01-01
1
last month
1
last week
Acq. date: 2026-01-09
Citations