Publication:
Impact of Si-passivation thickness and processing on NBTI reliability of Ge and SiGe pMOSFETs
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1846 since deposited on 2021-10-17
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Acq. date: 2026-07-18
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Statistics
Views
1846 since deposited on 2021-10-17
3last month
3last week
Acq. date: 2026-07-18
Citations