Publication:
Impact of Si-passivation thickness and processing on NBTI reliability of Ge and SiGe pMOSFETs
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1835 since deposited on 2021-10-17
2last month
Acq. date: 2026-01-09
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Metrics
Views
1835 since deposited on 2021-10-17
2last month
Acq. date: 2026-01-09
Citations