Publication:
Impact of Si-passivation thickness and processing on NBTI reliability of Ge and SiGe pMOSFETs
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1864 since deposited on 2021-10-17
11last month
Acq. date: 2026-09-13
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Statistics
Views
1864 since deposited on 2021-10-17
11last month
Acq. date: 2026-09-13
Citations