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Polarized neutron reflectometry on lithographically patterned thin film structures
Publication:
Polarized neutron reflectometry on lithographically patterned thin film structures
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Temst, K.
;
Van Bael, M.J.
;
Swerts, J.
;
Loosvelt, H.
;
Popova, E.
;
Buntinx, D.
;
Bekaert, Joost
;
Van Haesendonck, C.
;
Bruynseraede, Y.
;
Jonckheere, Rik
;
Fritzsche, H.
Journal
Superlattices and microstructures
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1917
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Acq. date: 2025-12-10
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Views
1917
since deposited on 2021-10-15
2
last month
Acq. date: 2025-12-10
Citations