Publication:
Freeze-out effects on the characteristics of deep submicron Si nMOSFETSs in the 77 K to 300 K range
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1980 since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations
Metrics
Views
1980 since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations