Freeze-out effects on the characteristics of deep submicron Si nMOSFETSs in the 77 K to 300 K range

dc.contributor.author	Croon, Jeroen
dc.contributor.author	Biesemans, Serge
dc.contributor.author	Kubicek, Stefan
dc.contributor.author	Simoen, Eddy
dc.contributor.author	De Meyer, Kristin
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Biesemans, Serge
dc.contributor.imecauthor	Kubicek, Stefan
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.imecauthor	De Meyer, Kristin
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-09-30T08:02:09Z
dc.date.available	2021-09-30T08:02:09Z
dc.date.embargo	9999-12-31
dc.date.issued	1997
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1785
dc.source.beginpage	187
dc.source.conference	Proceedings of the 4th Symposium on Low Temperature Electronics and High Temperature Superconductivity
dc.source.conferencedate	4/05/1997
dc.source.conferencelocation	Montréal Canada
dc.source.endpage	198
dc.title	Freeze-out effects on the characteristics of deep submicron Si nMOSFETSs in the 77 K to 300 K range
dc.type	Proceedings paper
dspace.entity.type	Publication
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