Publication:

Electromigration limits of copper nano-interconnects

Date

2021

Proceedings Paper

https://doi.org/10.1109/IRPS46558.2021.9405091

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Author(s)

Zahedmanesh, Houman

;

Varela Pedreira, Olalla

;

;

Journal

na

Metrics

1735 since deposited on 2022-03-11

2last month

Acq. date: 2025-12-17