Publication:

Electromigration limits of copper nano-interconnects

Date

2021

Proceedings Paper

https://doi.org/10.1109/irps46558.2021.9405091

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Author(s)

Zahedmanesh, Houman

;

Varela Pedreira, Olalla

;

;

Journal

na

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Acq. date: 2026-10-06