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An analytical compact model for estimation of stress in multiple through-silicon via configurations
Publication:
An analytical compact model for estimation of stress in multiple through-silicon via configurations
Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eneman, Geert
;
Cho, Jong Hoon
;
Moroz, Victor
;
Milojevic, Dragomir
;
Choi, Munkang
;
De Meyer, Kristin
;
Mercha, Abdelkarim
;
Beyne, Eric
;
Hoffmann, Thomas Y.
;
Van der Plas, Geert
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1905
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
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Views
1905
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations