Publication:

Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations

Date

2023-05-15
Proceedings Paper
https://doi.org/10.1109/IRPS48203.2023.10118211
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 5.11 MB
Accepted version 5.38 MB

Author(s)

Vandemaele, Michiel  
;
Kaczer, Ben  
;
Bury, Erik  
;
Franco, Jacopo  
;
Vaisman Chasin, Adrian  
;
Makarov, Alexander  
;
Mertens, Hans  
;
Hellings, Geert  
;
Groeseneken, Guido  

Journal

2023 IEEE International Reliability Physics Symposium (IRPS)

Abstract

Description

Metrics

Downloads

575 since deposited on 2023-07-15
54last month
10last week
Acq. date: 2026-01-10

Views

1195 since deposited on 2023-07-15
1last month
Acq. date: 2026-01-10

Citations

Metrics

Downloads

575 since deposited on 2023-07-15
54last month
10last week
Acq. date: 2026-01-10

Views

1195 since deposited on 2023-07-15
1last month
Acq. date: 2026-01-10

Citations