Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
EFTEM as a porosity metrology tool for low-k dielectrics
Publication:
EFTEM as a porosity metrology tool for low-k dielectrics
Copy permalink
Date
2002
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hens, S.
;
Bender, Hugo
;
Van Landuyt, J.
;
Iacopi, Francesca
;
Weidner, K.
;
Maex, Karen
Journal
Abstract
Description
Metrics
Views
1903
since deposited on 2021-10-14
1
last month
Acq. date: 2026-01-09
Citations
Metrics
Views
1903
since deposited on 2021-10-14
1
last month
Acq. date: 2026-01-09
Citations