Publication:
Low-frequency noise assessment of the oxide quality of gate-last high-k pMOSFETS
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1812 since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations
Metrics
Views
1812 since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations