Publication:
Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterization
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1947 since deposited on 2021-10-23
1last month
Acq. date: 2026-04-05
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Statistics
Views
1947 since deposited on 2021-10-23
1last month
Acq. date: 2026-04-05
Citations