Publication:
SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part II: time-dependent variability in nanoscaled devices and other reliability issues
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Acq. date: 2026-08-05
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359 since deposited on 2021-10-21
42last month
14last week
Acq. date: 2026-08-05
Views
1818 since deposited on 2021-10-21
2last month
Acq. date: 2026-08-05
Citations