Publication:
SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part II: time-dependent variability in nanoscaled devices and other reliability issues
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302 since deposited on 2021-10-21
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Acq. date: 2026-05-09
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1815 since deposited on 2021-10-21
Acq. date: 2026-05-09
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302 since deposited on 2021-10-21
43last month
8last week
Acq. date: 2026-05-09
Views
1815 since deposited on 2021-10-21
Acq. date: 2026-05-09
Citations