Publication:
SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part II: time-dependent variability in nanoscaled devices and other reliability issues
Date
Loading...
Journal
Abstract
Description
Statistics
Downloads
227 since deposited on 2021-10-21
38last month
9last week
Acq. date: 2026-03-17
Views
1815 since deposited on 2021-10-21
Acq. date: 2026-03-17
Citations
Statistics
Downloads
227 since deposited on 2021-10-21
38last month
9last week
Acq. date: 2026-03-17
Views
1815 since deposited on 2021-10-21
Acq. date: 2026-03-17
Citations