Publication:
Properties of NbxTi(1-x)N thin films deposited on 300 mm silicon wafers for upscaling superconducting digital circuits
Loading...
Journal
Abstract
Description
Metrics
Views
110 since deposited on 2024-06-25
Acq. date: 2025-12-10
Citations
Metrics
Views
110 since deposited on 2024-06-25
Acq. date: 2025-12-10
Citations