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Articles
Practical Challenges of High-Power IGBT's I-V Curve Measurement and Its Importance in Reliability Analysis
Publication:
Practical Challenges of High-Power IGBT's I-V Curve Measurement and Its Importance in Reliability Analysis
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Date
2021
Journal article
https://doi.org/10.3390/electronics10172095
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Alavi, Omid
;
Van Cappellen, Leander
;
De Ceuninck, Ward
;
Daenen, Michaël
Journal
ELECTRONICS
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1459
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Downloads
96
since deposited on 2021-11-02
5
last month
Acq. date: 2026-01-06
Views
1459
since deposited on 2021-11-02
2
last month
1
last week
Acq. date: 2026-01-06
Citations