Practical Challenges of High-Power IGBT's I-V Curve Measurement and Its Importance in Reliability Analysis

dc.contributor.author	Alavi, Omid
dc.contributor.author	Van Cappellen, Leander
dc.contributor.author	De Ceuninck, Ward
dc.contributor.author	Daenen, Michaël
dc.contributor.imecauthor	Alavi, Omid
dc.contributor.imecauthor	Van Cappellen, Leander
dc.contributor.imecauthor	De Ceuninck, Ward
dc.contributor.imecauthor	Daenen, Michaël
dc.contributor.orcidimec	Alavi, Omid::0000-0001-6426-8485
dc.contributor.orcidimec	De Ceuninck, Ward::0000-0002-4630-5569
dc.contributor.orcidimec	Daenen, Michaël::0000-0002-9221-4932
dc.date.accessioned	2023-01-17T08:34:33Z
dc.date.available	2021-11-02T15:57:16Z
dc.date.available	2023-01-17T08:34:33Z
dc.date.embargo	2021-08-29
dc.date.issued	2021
dc.identifier.doi	10.3390/electronics10172095
dc.identifier.issn	2079-9292
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/37589
dc.publisher	MDPI
dc.source.beginpage	2095
dc.source.endpage	na
dc.source.issue	17
dc.source.journal	ELECTRONICS
dc.source.numberofpages	14
dc.source.volume	10
dc.subject.keywords	GATE VOLTAGE
dc.subject.keywords	MODULE
dc.title	Practical Challenges of High-Power IGBT's I-V Curve Measurement and Its Importance in Reliability Analysis
dc.type	Journal article
dspace.entity.type	Publication
Files	Original bundle Name: electronics-10-02095.pdf Size: 7.75 MB Format: Adobe Portable Document Format Description: Published version Download
Publication available in collections:	Articles