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Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit
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Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit
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Date
2018
Proceedings Paper
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38814.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Beek, Simon
;
Roussel, Philippe
;
O'Sullivan, Barry
;
Degraeve, Robin
;
Cosemans, Stefan
;
Linten, Dimitri
;
Kar, Gouri Sankar
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Acq. date: 2025-12-15
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Views
1864
since deposited on 2021-10-26
1
last month
1
last week
Acq. date: 2025-12-15
Citations