Publication:

Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit

Date

2018
Proceedings Paper
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dc.contributor.authorVan Beek, Simon
dc.contributor.authorRoussel, Philippe
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorDegraeve, Robin
dc.contributor.authorCosemans, Stefan
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-26T06:23:32Z
dc.date.available2021-10-26T06:23:32Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32010
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8486879
dc.source.beginpage146
dc.source.conference48th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate3/09/2018
dc.source.conferencelocationDresden Germany
dc.source.endpage149
dc.title

Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit

dc.typeProceedings paper
dspace.entity.typePublication
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