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Why are nonlinear microwave systems measurements so involved?
Publication:
Why are nonlinear microwave systems measurements so involved?
Date
2004-06
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rolain, Yves
;
Van Moer, Wendy
;
Schoukens, Johan
;
Vandersteen, Gerd
Journal
IEEE Trans. Instrumation and Measurement
Abstract
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1956
since deposited on 2021-10-15
Acq. date: 2025-10-27
Citations
Metrics
Views
1956
since deposited on 2021-10-15
Acq. date: 2025-10-27
Citations