Publication:
Why are nonlinear microwave systems measurements so involved?
Date
| dc.contributor.author | Rolain, Yves | |
| dc.contributor.author | Van Moer, Wendy | |
| dc.contributor.author | Schoukens, Johan | |
| dc.contributor.author | Vandersteen, Gerd | |
| dc.contributor.imecauthor | Vandersteen, Gerd | |
| dc.date.accessioned | 2021-10-15T15:53:53Z | |
| dc.date.available | 2021-10-15T15:53:53Z | |
| dc.date.issued | 2004-06 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9525 | |
| dc.source.beginpage | 726 | |
| dc.source.endpage | 729 | |
| dc.source.issue | 3 | |
| dc.source.journal | IEEE Trans. Instrumation and Measurement | |
| dc.source.volume | 53 | |
| dc.title | Why are nonlinear microwave systems measurements so involved? | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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