Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Defect-location identification for cell-aware test
Publication:
Defect-location identification for cell-aware test
Date
2019-03
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gao, Zhan
;
Malagi, Santosh
;
Marinissen, Erik Jan
;
Swenton, Joe
;
Huisken, Jos
;
Goossens, Kees
Journal
Abstract
Description
Metrics
Views
1895
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations
Metrics
Views
1895
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations