Publication:
Defect-location identification for cell-aware test
Date
| dc.contributor.author | Gao, Zhan | |
| dc.contributor.author | Malagi, Santosh | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Swenton, Joe | |
| dc.contributor.author | Huisken, Jos | |
| dc.contributor.author | Goossens, Kees | |
| dc.contributor.imecauthor | Gao, Zhan | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-27T09:30:49Z | |
| dc.date.available | 2021-10-27T09:30:49Z | |
| dc.date.issued | 2019-03 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/33012 | |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8704561 | |
| dc.source.beginpage | 1 | |
| dc.source.conference | IEEE Latin-American Test Symposium (LATS'19) | |
| dc.source.conferencedate | 11/03/2019 | |
| dc.source.conferencelocation | Santiago Chili | |
| dc.source.endpage | 6 | |
| dc.title | Defect-location identification for cell-aware test | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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