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Quantitative carrier profiling of silicon devices by nano-srp
Publication:
Quantitative carrier profiling of silicon devices by nano-srp
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Peter
;
Clarysse, Trudo
;
Caymax, Matty
;
Vandervorst, Wilfried
;
Snauwaerts, Jan
;
Hellemans, L.
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1951
since deposited on 2021-09-29
Acq. date: 2025-12-12
Citations
Metrics
Views
1951
since deposited on 2021-09-29
Acq. date: 2025-12-12
Citations