Publication:

Fundamental understanding of NBTI degradation mechanism in IGZO channel devices

Date

2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529352
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Accepted version 1.71 MB

Author(s)

Zhao, Ying  
;
Rinaudo, Pietro  
;
Vaisman Chasin, Adrian  
;
Truijen, Brecht  
;
Kaczer, Ben  
;
Rassoul, Nouredine  
;
Dekkers, Harold  
;
Belmonte, Attilio  
;
De Wolf, Ingrid  
;
Kar, Gouri Sankar  
;
Franco, Jacopo  

Journal

N/A

Abstract

Description

Statistics

Downloads

1431 since deposited on 2024-08-16
204last month
53last week
Acq. date: 2026-05-19

Views

636 since deposited on 2024-08-16
Acq. date: 2026-05-19

Citations

Statistics

Downloads

1431 since deposited on 2024-08-16
204last month
53last week
Acq. date: 2026-05-19

Views

636 since deposited on 2024-08-16
Acq. date: 2026-05-19

Citations