Publication:

Fundamental understanding of NBTI degradation mechanism in IGZO channel devices

Date

2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529352
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dc.contributor.authorZhao, Ying
dc.contributor.authorRinaudo, Pietro
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorTruijen, Brecht
dc.contributor.authorKaczer, Ben
dc.contributor.authorRassoul, Nouredine
dc.contributor.authorDekkers, Harold
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorFranco, Jacopo
dc.contributor.imecauthorZhao, Ying
dc.contributor.imecauthorRinaudo, Pietro
dc.contributor.imecauthorTruijen, Brecht
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRassoul, Nouredine
dc.contributor.imecauthorDekkers, Harold
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecZhao, Ying::0000-0002-7758-5655
dc.contributor.orcidimecRinaudo, Pietro::0000-0001-7676-1306
dc.contributor.orcidimecTruijen, Brecht::0000-0002-2288-1414
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRassoul, Nouredine::0000-0001-9489-3396
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.contributor.orcidimecBelmonte, Attilio::0000-0002-3947-1948
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.date.accessioned2024-09-19T14:49:02Z
dc.date.available2024-08-16T18:28:07Z
dc.date.available2024-09-19T14:49:02Z
dc.date.embargo2024-05-16
dc.date.issued2024
dc.identifier.doi10.1109/IRPS48228.2024.10529352
dc.identifier.eisbn979-8-3503-6976-2
dc.identifier.isbn979-8-3503-6977-9
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44320
dc.publisherIEEE
dc.source.conferenceInternational Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 14-18, 2024
dc.source.conferencelocationGrapevine
dc.source.journalN/A
dc.source.numberofpages7
dc.title

Fundamental understanding of NBTI degradation mechanism in IGZO channel devices

dc.typeProceedings paper
dspace.entity.typePublication
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