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Metal Etch Depth Metrology using YieldStar and CDSEM
Publication:
Metal Etch Depth Metrology using YieldStar and CDSEM
Date
2024
Proceedings Paper
https://doi.org/10.1109/ASMC61125.2024.10545490
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Anunciado, Roy
;
Aliaj, Ilirjan
;
van Haren, Richard
;
Truffert, Vincent
;
Moussa, Alain
;
Goossens, Danny
;
Tamaddon, Amir-Hossein
Journal
N/A
Abstract
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Views
142
since deposited on 2024-07-31
Acq. date: 2025-10-27
Citations
Metrics
Views
142
since deposited on 2024-07-31
Acq. date: 2025-10-27
Citations