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Mechanisms for undesired nucleation on H-terminated Si and dimethylamino-trimethylsilane passivated SiO2 during TiO2 area-selective atomic layer deposition
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Mechanisms for undesired nucleation on H-terminated Si and dimethylamino-trimethylsilane passivated SiO2 during TiO2 area-selective atomic layer deposition
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Date
2022
Journal article
https://doi.org/10.1063/5.0106132
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2.38 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nye, Rachel
;
Song, Seung Keun
;
Van Dongen, Kaat
;
Delabie, Annelies
;
Parsons, Gregory N.
Journal
APPLIED PHYSICS LETTERS
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214
since deposited on 2022-11-20
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last week
Acq. date: 2025-12-15
Views
1180
since deposited on 2022-11-20
Acq. date: 2025-12-15
Citations
Metrics
Downloads
214
since deposited on 2022-11-20
45
last month
6
last week
Acq. date: 2025-12-15
Views
1180
since deposited on 2022-11-20
Acq. date: 2025-12-15
Citations