Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Presentations
Atom-probe for arsenic implant doped FinFET characterization
Publication:
Atom-probe for arsenic implant doped FinFET characterization
Date
2012
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kambham, Ajay Kumar
;
Kumar, Arul
;
Gilbert, Matthieu
;
Vandervorst, Wilfried
Journal
Abstract
Description
Metrics
Views
1926
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1926
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations