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Effects of hole self-trapping by polarons on transport and negative bias illumination stress in amorphous-IGZO
Publication:
Effects of hole self-trapping by polarons on transport and negative bias illumination stress in amorphous-IGZO
Date
2017
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Jamblinne de Meux, Albert
;
Pourtois, Geoffrey
;
Genoe, Jan
;
Heremans, Paul
Journal
Journal of Applied Physics
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1877
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations
Metrics
Views
1877
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations