Effects of hole self-trapping by polarons on transport and negative bias illumination stress in amorphous-IGZO

dc.contributor.author	de Jamblinne de Meux, Albert
dc.contributor.author	Pourtois, Geoffrey
dc.contributor.author	Genoe, Jan
dc.contributor.author	Heremans, Paul
dc.contributor.imecauthor	Pourtois, Geoffrey
dc.contributor.imecauthor	Genoe, Jan
dc.contributor.imecauthor	Heremans, Paul
dc.contributor.orcidimec	Pourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimec	Genoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimec	Heremans, Paul::0000-0003-2151-1718
dc.date.accessioned	2021-10-24T03:49:10Z
dc.date.available	2021-10-24T03:49:10Z
dc.date.issued	2017
dc.identifier.issn	0021-8979
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/28128
dc.identifier.url	http://aip.scitation.org/doi/10.1063/1.4986180
dc.source.beginpage	161513
dc.source.issue	16
dc.source.journal	Journal of Applied Physics
dc.source.volume	123
dc.title	Effects of hole self-trapping by polarons on transport and negative bias illumination stress in amorphous-IGZO
dc.type	Journal article
dspace.entity.type	Publication
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