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Energy and angular dependence of the sputter yield and ionization yield of Ge bombarded by O2+
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Energy and angular dependence of the sputter yield and ionization yield of Ge bombarded by O2+
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Date
2004-06
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Huyghebaert, Cedric
;
Conard, Thierry
;
Vandervorst, Wilfried
Journal
Applied Surface Science
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1840
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations
Metrics
Views
1840
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations