Publication:
Analysis of the interface trap density in SOI FinFETs with different TiN gate electrode thickness through charge pumping technique
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1885 since deposited on 2021-10-18
1last month
Acq. date: 2025-12-08
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Metrics
Views
1885 since deposited on 2021-10-18
1last month
Acq. date: 2025-12-08
Citations