Publication:
Analysis of the interface trap density in SOI FinFETs with different TiN gate electrode thickness through charge pumping technique
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1889 since deposited on 2021-10-18
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Acq. date: 2026-01-26
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Statistics
Views
1889 since deposited on 2021-10-18
1last month
1last week
Acq. date: 2026-01-26
Citations