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Incubation, time-dependent drift and saturation during Al-Si-Cu electromigration: modelling and implications for design
Publication:
Incubation, time-dependent drift and saturation during Al-Si-Cu electromigration: modelling and implications for design
Date
1998
Proceedings Paper
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2646.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Witvrouw, Ann
;
Roussel, Philippe
;
Beyer, Gerald
;
Proost, Joris
;
Maex, Karen
Journal
Abstract
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1
since deposited on 2021-10-01
Acq. date: 2025-10-23
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1858
since deposited on 2021-10-01
Acq. date: 2025-10-23
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Downloads
1
since deposited on 2021-10-01
Acq. date: 2025-10-23
Views
1858
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations