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Trap reduction and performances improvements study after high pressure anneal process on single crystal channel 3D NAND devices
Publication:
Trap reduction and performances improvements study after high pressure anneal process on single crystal channel 3D NAND devices
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Date
2018
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Subirats, Alexandre
;
Arreghini, Antonio
;
Delhougne, Romain
;
Rosseel, Erik
;
Hikavyy, Andriy
;
Breuil, Laurent
;
Vadakupudhu Palayam, Senthil
;
Van den Bosch, Geert
;
Linten, Dimitri
;
Furnemont, Arnaud
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1
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Acq. date: 2026-01-06
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1983
since deposited on 2021-10-26
Acq. date: 2026-01-06
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Downloads
1
since deposited on 2021-10-26
Acq. date: 2026-01-06
Views
1983
since deposited on 2021-10-26
Acq. date: 2026-01-06
Citations