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Impact of the combination of stress buffer layer and wafer level underfill on 3D IC assembly using thermal compression bonding
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Impact of the combination of stress buffer layer and wafer level underfill on 3D IC assembly using thermal compression bonding
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Date
2017
Proceedings Paper
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34731.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duval, Fabrice
;
Wang, Teng
;
Bex, Pieter
;
Lofrano, Melina
;
Rebibis, Kenneth June
;
Sleeckx, Erik
;
Beyne, Eric
;
Gerets, Carine
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1868
since deposited on 2021-10-24
Acq. date: 2025-12-16
Citations
Metrics
Views
1868
since deposited on 2021-10-24
Acq. date: 2025-12-16
Citations