Publication:

Optimized EUV mask absorber stack for improved imaging by reducing roughness and crystallinity of alternative absorber materials

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1935 since deposited on 2021-10-23
Acq. date: 2025-12-11

Citations

Metrics

Views

1935 since deposited on 2021-10-23
Acq. date: 2025-12-11

Citations