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Spectroscopic ellipsometry and ellipsometric porosimetry studies of CVD low-k dielectric films
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Spectroscopic ellipsometry and ellipsometric porosimetry studies of CVD low-k dielectric films
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marsik, Premysl
;
Verdonck, Patrick
;
Schneider, Dieter
;
De Roest, David
;
Kaneko, Shinya
;
Baklanov, Mikhaïl
Journal
Physica Status Solidi C
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1879
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Acq. date: 2025-12-11
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Views
1879
since deposited on 2021-10-17
2
last month
Acq. date: 2025-12-11
Citations