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Defects generation in SiO2/HfO2 studied with variable Tcharge-Tdischarge charge pumping (VT2CP)
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1906 since deposited on 2021-10-16
2last month
Acq. date: 2025-12-10
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1906 since deposited on 2021-10-16
2last month
Acq. date: 2025-12-10
Citations