Publication:
Defects generation in SiO2/HfO2 studied with variable Tcharge-Tdischarge charge pumping (VT2CP)
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1908 since deposited on 2021-10-16
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Acq. date: 2026-01-25
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1908 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-01-25
Citations