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Defects generation in SiO2/HfO2 studied with variable Tcharge-Tdischarge charge pumping (VT2CP)
Publication:
Defects generation in SiO2/HfO2 studied with variable Tcharge-Tdischarge charge pumping (VT2CP)
Date
2007
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zahid, Mohammed
;
Degraeve, Robin
;
Pantisano, Luigi
;
Zhang, John
;
Groeseneken, Guido
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1903
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
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Views
1903
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations