Publication:

Low-frequency noise measurements for electromigration characterization in BEOL interconnects

Date

2019

Proceedings Paper

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Files

44368.pdf 1.77 MB

Author(s)

;

;

Varela Pedreira, Olalla

;

Arnoldi, Laurent

;

van der Veen, Marleen

;

De Wolf, Ingrid

;

Statistics

1963 since deposited on 2021-10-27

4last month

Acq. date: 2026-08-10